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Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology.

Riaz NaseerJeff DraperYounes BoulghassoulSandeepan DasGuptaArt Witulski
Published in: ACM Great Lakes Symposium on VLSI (2007)
Keyphrases
  • cmos technology
  • object oriented
  • low cost
  • image processing
  • spl times