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Large-signal two-terminal device model for nanoelectronic circuit analysis.
Garrett S. Rose
Matthew M. Ziegler
Mircea R. Stan
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2004)
Keyphrases
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computational model
objective function
experimental data
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statistical analysis
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probabilistic model
multiscale
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maximum likelihood
genetic algorithm
management system
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image analysis
neural network model
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