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Thermo-mechanical Analysis and Fatigue Life Prediction for Integrated Circuits (ICs).

Aziz OukairaTouati Djallel eddineAhmad HassanMohamed AliYvon SavariaAhmed Lakhssassi
Published in: MWSCAS (2021)
Keyphrases
  • integrated circuit
  • prediction accuracy
  • bayesian networks
  • statistical analysis
  • prediction model
  • databases
  • information retrieval
  • expert systems
  • evolutionary algorithm