Combined circuit and microarchitecture techniques for effective soft error robustness in SMT processors.

Xin Fu Tao Li José A. B. Fortes

Published in: DSN (2008)

Keyphrases

circuit design
information systems
high speed
error rate
early stage
low cost
error analysis
real time
neural network
image processing
high quality
parallel algorithm
error propagation
statistical machine translation
analog vlsi