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Trapping Phenomena in GaN HEMTs with Fe- and C-doped Buffer.

Kexin LiTakashi MatsudaEiji YagyuKoon Hoo TeoShaloo Rakheja
Published in: DRC (2022)
Keyphrases
  • finite element
  • room temperature
  • learning rate
  • buffer size
  • computer vision
  • buffer allocation
  • real time
  • data sets
  • real world
  • artificial intelligence
  • three dimensional
  • image analysis