Efficient built-in self-test algorithm for memory.
Sying-Jyan WangChen-Jung WeiPublished in: Asian Test Symposium (2000)
Keyphrases
- improved algorithm
- experimental evaluation
- learning algorithm
- times faster
- computationally efficient
- neural network
- computational cost
- linear programming
- recognition algorithm
- detection algorithm
- optimization algorithm
- expectation maximization
- probabilistic model
- simulated annealing
- single pass
- high efficiency
- highly efficient
- objective function
- np hard
- preprocessing
- computational complexity
- theoretical analysis
- memory requirements
- face recognition
- image sequences
- k means
- cost function
- memory usage
- memory size