Fixed- and variable-length ring oscillators for variability characterization in 45nm CMOS.

Ji-Hoon Park Liang-Teck Pang Kenneth Duong Borivoje Nikolic

Published in: CICC (2009)

Keyphrases

variable length
fixed length
cmos technology
n gram
silicon on insulator
statistical dependencies
power consumption
nm technology
high speed
communication systems
low cost
bitstream
metal oxide semiconductor
error correction
text compression
low voltage
low power
machine learning
spatio temporal
bayesian networks