Low frequency MOS-CV technique for selfconsistent determination of dark currents in high resistivity substrates.
Roland SorgeJ. QuickPeter SchleyD. K. BolzeThomas GrabollaPublished in: ESSDERC (2014)
Keyphrases
- low frequency
- high frequency
- frequency domain
- room temperature
- discrete wavelet transform
- wavelet transform
- frequency band
- subband
- wavelet coefficients
- wavelet analysis
- electromagnetic fields
- high frequency components
- low pass
- original images
- dct coefficients
- magnetic field
- spatial domain
- subband decomposition
- fusion rules
- high resolution