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Systematic Study on Positive Bias Temperature Instability(PBTI) of ZrO2-based Ge nMOSFETs with Interlayer Passivations.

Lulu ChouXiao YuHuan LiuYan LiuGenquan HanYue Hao
Published in: ICICDT (2022)
Keyphrases
  • genetic algorithm
  • learning rate