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Systematic Study on Positive Bias Temperature Instability(PBTI) of ZrO2-based Ge nMOSFETs with Interlayer Passivations.
Lulu Chou
Xiao Yu
Huan Liu
Yan Liu
Genquan Han
Yue Hao
Published in:
ICICDT (2022)
Keyphrases
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genetic algorithm
learning rate