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A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter.

Tian ChenHuaguo LiangMinsheng ZhangWei Wang
Published in: ICYCS (2008)
Keyphrases
  • classification scheme
  • neural network
  • real world
  • secret sharing scheme
  • real time
  • data sets
  • lower bound
  • hidden markov models
  • wireless sensor networks
  • fully unsupervised
  • segmentation scheme