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A 215-F² Bistable Physically Unclonable Function With an ACF of <0.005 and a Native Bit Instability of 2.05% in 65-nm CMOS Process.

Gang LiPengjun WangXuejiao MaJiana LianJunpeng ShuYuejun Zhang
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2020)
Keyphrases
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