TSV Extracted Equivalent Circuit Model and an On-Chip Test Solution.

Zheng Gong Rashid Rashidzadeh

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2016)

Keyphrases

mathematical model
low cost
experimental data
probabilistic model
probability distribution
objective function
optimal solution
real time
image segmentation
pattern recognition
state space
sensitivity analysis
convex optimization