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ECRA Co-Editors' Introduction for Volume 9, Issue 3, May-June 2010.

Robert J. KauffmanPatrick Y. K. ChauTerry R. PayneJ. Christopher Westland
Published in: Electron. Commer. Res. Appl. (2010)
Keyphrases
  • special issue
  • real world
  • three dimensional
  • wide range
  • databases
  • data mining
  • computer vision
  • feature selection
  • image processing
  • decision trees
  • bayesian networks
  • multiscale
  • search algorithm
  • color images
  • volume data