Performance Assessment of Dual Metal Graded Channel Negative Capacitance Junctionless FET for Digital/Analog field.
Shalini ChaudharyBasudha DewanChitrakant SahuMenka YadavPublished in: iSES (2021)
Keyphrases
- field effect transistors
- circuit design
- steady state
- high speed
- mixed signal
- positive and negative
- multi channel
- printed circuit
- low power
- imaging technology
- digital image analysis
- mathematical analysis
- cmos image sensor
- unit length
- data conversion
- optimal solution
- communication channels
- low complexity
- signal processing
- lower bound