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Load-Pull Methodology to Characterize GaN High-Electron-Mobility Transistors (HEMTs).

Nhu Q. TranLoc T. P. NguyenTri M. DoQuan M. Hoang
Published in: ICO (2022)
Keyphrases
  • image processing
  • wide range
  • database
  • wireless networks
  • power consumption
  • real time
  • long term