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Integrated, Speckle-Based Displacement Measurement for Lateral Scanning White Light Interferometry.

Gert BehrendsDirk StöbenerAndreas Fischer
Published in: Sensors (2021)
Keyphrases
  • white light interferometry
  • image processing
  • optical flow
  • thin film
  • ultrasound images
  • scan data
  • viewpoint
  • sar images
  • synthetic aperture radar
  • structured light