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Integrated, Speckle-Based Displacement Measurement for Lateral Scanning White Light Interferometry.
Gert Behrends
Dirk Stöbener
Andreas Fischer
Published in:
Sensors (2021)
Keyphrases
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white light interferometry
image processing
optical flow
thin film
ultrasound images
scan data
viewpoint
sar images
synthetic aperture radar
structured light