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Gate length dependence of bias temperature instability behavior in short channel SOI MOSFETs.

Wangran WuJ. LuChang LiuHeng WuXiaoyu TangJiabao SunRui ZhangWenjie YuXi WangYi Zhao
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • multiple input
  • communication channels
  • behavior patterns
  • channel coding
  • total length
  • multiple access
  • field effect transistors
  • dependence structure