Impact of Linearity and Write Noise of Analog Resistive Memory Devices in a Neural Algorithm Accelerator.
Robin B. Jacobs-GedrimSapan AgarwalKathrine E. KniselyJim E. StevensMichael S. van HeukelomDavid R. HughartJohn NiroulaConrad D. JamesMatthew J. MarinellaPublished in: ICRC (2017)
Keyphrases
- detection algorithm
- cost function
- memory usage
- matching algorithm
- dynamic programming
- memory space
- memory requirements
- optimal solution
- experimental evaluation
- learning algorithm
- associative memory
- optimization algorithm
- neural network
- similarity measure
- significant improvement
- computational complexity
- objective function
- parallel implementation
- estimation error
- np hard
- worst case
- computational cost
- noisy data
- k means
- convergence rate
- expectation maximization
- input data
- gaussian noise
- learning rules
- decision trees