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Modeling Ionizing Radiation Effects in Solid State Materials and CMOS Devices.
Hugh J. Barnaby
Michael L. McLain
Ivan Sanchez Esqueda
Xiao J. Chen
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2009)
Keyphrases
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solid state
cmos image sensor
ionizing radiation
random access
image sensor
flash memory
multi view
power consumption
embedded systems
image processing
image sequences
high quality