A Random Onset Model for Degradation of High-Reliability Systems.

Scott A. Vander Wiel Alyson G. Wilson Todd L. Graves C. Shane Reese

Published in: Technometrics (2011)

Keyphrases

high reliability
statistical model
management system
computer vision
probabilistic model
probability distribution
high accuracy
theoretical analysis
mathematical model
experimental data
real time
high level
multiscale
theoretical framework
computational models