Login / Signup

Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry.

Tong GuoSiming WangDante J. Dorantes-GonzalezJinping ChenXing FuXiaotang Hu
Published in: Sensors (2012)
Keyphrases
  • white light
  • image processing
  • viewpoint
  • face recognition
  • palmprint recognition