Cohesion Failure Analysis in a Bi-layered Copper/Kapton Structure for Flexible Hybrid Electronic Sensing Applications.
Simin MasihiMasoud PanahiDinesh MaddipatlaSajjad HajianArnesh K. BoseV. PalaniappanBinu B. NarakathuBradley J. BazuinMassood Z. AtashbarPublished in: EIT (2021)