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Testing current mode two-input logic gates.

S. H. AmerAhmed S. EmaraR. Mohie El-DinM. M. FouadAhmed H. MadianHassanein H. AmerMohamed B. AbdelhalimH. H. Draz
Published in: CCECE (2014)
Keyphrases
  • modal logic
  • logic circuits
  • neural network
  • low cost
  • data sets
  • information retrieval
  • logic programs
  • future development
  • automated reasoning