A New Critical Area Simulation Algorithm and Its Application for Failing Bit Analysis.
Chizu MatsumotoYuichi HamamuraYoshiyuki TsunodaHiroshi UozakiIsao MiyazakiShiro KamoharaYoshiyuki KanekoKenji KanamitsuPublished in: IEICE Trans. Electron. (2011)
Keyphrases
- computationally efficient
- detection algorithm
- experimental evaluation
- high accuracy
- mathematical analysis
- improved algorithm
- probabilistic model
- expectation maximization
- computational cost
- np hard
- dynamic programming
- cost function
- recognition algorithm
- times faster
- learning algorithm
- k means
- search space
- linear programming
- mathematical model
- selection algorithm
- optimization algorithm
- segmentation algorithm
- itemsets
- particle swarm optimization
- simulated annealing
- clustering method
- worst case
- tree structure
- significant improvement
- convergence rate
- preprocessing
- computational complexity
- optimal solution
- objective function