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Analysis of Error Masking and Restoring Properties of Sequential Circuits.

Jinghang LiangJie HanFabrizio Lombardi
Published in: IEEE Trans. Computers (2013)
Keyphrases
  • statistical analysis
  • real time
  • image analysis
  • error analysis
  • database
  • data sets
  • databases
  • machine learning
  • artificial intelligence
  • e learning
  • decision trees
  • data analysis
  • power consumption
  • structural properties