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Resistive Switching Behavior of Solution-Processed AlOx, based RRAM with Ni and TiN Top Electrode at Low Annealing Temperatures.

Zong Jie ShenCe Zhou ZhaoLi YangChun Zhao
Published in: ISOCC (2019)
Keyphrases
  • case study
  • optimal solution
  • monte carlo
  • closed form
  • simulated annealing
  • linear equations
  • database
  • real time
  • image segmentation
  • multiscale
  • mathematical model
  • optimization method
  • electric field