Transient Force Atomic Force Microscopy: A New Nano-Interrogation Method.
Deepak R. SahooPranav AgarwalMurti V. SalapakaPublished in: ACC (2007)
Keyphrases
- synthetic data
- detection method
- significant improvement
- support vector machine
- high precision
- high accuracy
- data sets
- experimental evaluation
- optimization method
- segmentation method
- image sequences
- error rate
- optimization algorithm
- theoretical analysis
- input image
- main contribution
- support vector machine svm
- detection algorithm
- fully automatic
- x ray
- feature set
- classification accuracy
- dynamic programming
- cost function
- prior knowledge
- feature vectors
- preprocessing
- objective function
- clustering algorithm
- learning algorithm
- genetic algorithm
- neural network