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17.4 CMOS impedance analyzer for nanosamples investigation operating up to 150MHz with Sub-aF resolution.
Giorgio Ferrari
Davide Bianchi
Angelo Rottigni
Marco Sampietro
Published in:
ISSCC (2014)
Keyphrases
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high speed
cmos technology
data acquisition
low power
nm technology
low resolution
high resolution
power consumption
high frequency
power supply
real time
sampling rate
image sensor
low cost
analog vlsi
data sets
image quality
higher resolution