Novel sizing algorithm for yield improvement under process variation in nanometer technology.
Seung Hoon ChoiBipul Chandra PaulKaushik RoyPublished in: DAC (2004)
Keyphrases
- times faster
- high accuracy
- cost function
- np hard
- detection algorithm
- worst case
- experimental evaluation
- dynamic programming
- estimation algorithm
- optimization process
- optimization algorithm
- learning algorithm
- computational complexity
- significant improvement
- genetic algorithm
- search space
- preprocessing
- improved algorithm
- image sequences
- objective function
- matching process
- recognition algorithm
- convergence rate
- matching algorithm
- clustering method
- optimal solution
- theoretical analysis
- linear programming
- simulated annealing
- probabilistic model
- k means