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A New Process Variation Monitoring Circuit.

Davit MirzoyanArarat Khachatryan
Published in: ISVLSI (2016)
Keyphrases
  • real time
  • databases
  • design process
  • process model
  • development process
  • machine learning
  • metadata
  • three dimensional
  • low cost
  • high speed
  • monitoring system
  • analog vlsi