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Temporal Characteristics of Top-Down Modulations during Working Memory Maintenance: An Event-related Potential Study of the N170 Component.

Kartik K. SreenivasanJennifer KatzAmishi P. Jha
Published in: J. Cogn. Neurosci. (2007)
Keyphrases
  • working memory
  • event related
  • cognitive load
  • temporal characteristics
  • individual differences
  • data mining
  • computational model
  • high level
  • data analysis