CAD utilities to comprehend layout-dependent stress effects in 45 nm high- performance SOI custom macro design.
Akif SultanJohn FaricelliSushant SuryagandhHans vanMeerKaveri MathurJames PattisonSean HannonGreg ConstantKalyana KumarKevin CarrejoJoe MeierRasit Onur TopalogluDarin ChanUwe HahnThorsten KnoppVictor AndradeBill GardiolSteve HejlDavid WuJames BullerLarry BairAli IcelYuri ApanovichPublished in: ISQED (2009)