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NBTI and hot-carrier effects in accumulation-mode Pi-gate pMOSFETs.

Chi-Woo LeeIsabelle FerainAryan AfzalianRan YanNima DehdashtiPedram RazaviJean-Pierre ColingeJong-Tae Park
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • artificial intelligence
  • information technology
  • multiresolution
  • individual differences
  • multiple input