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Software-Defect Localisation by Mining Dataflow-Enabled Call Graphs.

Frank EichingerKlaus KrogmannRoland KlugKlemens Böhm
Published in: ECML/PKDD (1) (2010)
Keyphrases
  • software defect
  • graph transformation
  • software defect prediction
  • graph data
  • text mining
  • data mining
  • least squares
  • pattern mining
  • high confidence
  • sample selection bias
  • confidence estimates