Polarity Dependency and 1/E Model of Gate Oxide TDDB Degradation in 3D NAND.

Lina Qu Shengwei Yang Ming He Rui Fang Xiaojuan Zhu Kun Han Yi He

Published in: IRPS (2023)

Keyphrases

probabilistic model
formal model
cost function
em algorithm
theoretical analysis
mathematical model
similarity measure
probability distribution
computational model
statistical model