Login / Signup
Polarity Dependency and 1/E Model of Gate Oxide TDDB Degradation in 3D NAND.
Lina Qu
Shengwei Yang
Ming He
Rui Fang
Xiaojuan Zhu
Kun Han
Yi He
Published in:
IRPS (2023)
Keyphrases
</>
probabilistic model
formal model
cost function
em algorithm
theoretical analysis
mathematical model
similarity measure
probability distribution
computational model
statistical model