A Normalized Quantitative Method for GaN HEMT Turn-ON Overvoltage Modeling and Suppressing.
Xiao LongWu LiangZhao JunGuozhu ChenPublished in: IEEE Trans. Ind. Electron. (2019)
Keyphrases
- similarity measure
- cost function
- significant improvement
- detection method
- preprocessing
- computational cost
- color images
- pairwise
- dynamic programming
- neural network
- computational complexity
- multiresolution
- probabilistic model
- wavelet transform
- input image
- clustering method
- high frequency
- noise reduction
- modeling method
- white noise