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Detecting artifacts on SNP chips.

Maurizio PellegrinoMayte Suárez-FariñasMarcelo O. MagnascoKnut M. Wittkowski
Published in: EMBC (2006)
Keyphrases
  • high quality
  • integrated circuit
  • automatic detection
  • high speed
  • statistical methods
  • genomic data
  • data sets
  • data analysis
  • computer systems