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Wavelength Shift Measurement With Resonance Characteristic Prediction Algorithm Using Intensities at Discrete Wavelengths.

Eudum KimSu-Jin JeonSun-Ho KimDo-Hyun KimJae-Sang LeeYoung-Wan Choi
Published in: IEEE Trans. Instrum. Meas. (2020)
Keyphrases
  • prediction algorithm
  • infrared
  • long run
  • feature selection
  • image coding