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Compact Gaussian Beam System for S-Parameter Characterization of Planar Structures at Millimeter-Wave Frequencies.

Shreyas IyerChih-Chieh ChengChong KimAbbas Abbaspour-Tamijani
Published in: IEEE Trans. Instrum. Meas. (2010)
Keyphrases
  • millimeter wave
  • imaging process
  • radar images
  • physical phenomena
  • maximum likelihood
  • multiresolution
  • markov random field
  • denoising