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A model for impact dynamics and its application to frequency analysis of tapping-mode atomic force microscopes.

Donatello MaterassiMichele BassoRoberto Genesio
Published in: CDC (2003)
Keyphrases
  • prior knowledge
  • frequency analysis
  • probabilistic model
  • denoising
  • dynamical systems
  • image processing
  • high quality
  • multiscale
  • pattern recognition
  • image registration
  • higher order
  • gaussian mixture model