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Deep Models for Engagement Assessment With Scarce Label Information.

Feng LiGuangfan ZhangWei WangRoger XuTom SchnellJonathan WenFrederic D. McKenzieJiang Li
Published in: IEEE Trans. Hum. Mach. Syst. (2017)
Keyphrases
  • probabilistic model
  • neural network
  • data mining
  • information retrieval
  • learning algorithm
  • learning environment
  • pattern recognition
  • prior knowledge