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Bit-Plane Specific Randomness Testing for Statistical Analysis of Ciphers.

Ram RatanBharat Lal Jangid Arvind
Published in: SocProS (1) (2019)
Keyphrases
  • statistical analysis
  • bit plane
  • probability model
  • bit planes
  • rate distortion
  • low complexity
  • image coding
  • post processing
  • wavelet coefficients
  • high frequency
  • bitstream