The classification methodology of chip quality using canonical correlation analysis-based variable selection on chip level data.
Ki-Hyun KimHyung-Shin KwonHee-Il HongHong-Sun HwangKang-Yong ChoGyo-Young JinPublished in: IEEM (2015)
Keyphrases
- variable selection
- input variables
- data sets
- database
- decision trees
- data analysis
- cross validation
- missing data
- gene expression microarray data
- text classification
- data mining techniques
- pattern recognition
- feature selection
- support vector machine
- input image
- supervised learning
- image data
- classification accuracy
- high dimensional data
- artificial neural networks
- feature space
- training data
- linear models