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Physics-based mixed-mode reverse recovery modeling and optimization of Si PiN and MPS fast recovery diodes.

Federica CappellutiFabrizio BonaniMauro FurnoGiovanni GhioneR. CartaL. BellemoC. BocchiolaLuigi Merlin
Published in: Microelectron. J. (2006)
Keyphrases
  • mixed mode
  • database
  • case study
  • x ray
  • image formation