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Across the Great Divide: Examination of Simulation Data with Actual Silicon Waveforms Improves Device Characterization and Production Test Development.
Tom Austin
Charisma Canlas
Brady Morgan
Jorge L. Rodriguez
Published in:
ITC (2002)
Keyphrases
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simulation data
numerical simulations
case study
data sets
software engineering
knowledge based systems
high speed
information processing
production system
semiconductor devices
database
pattern recognition
knowledge management
development process
software testing