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Optimal Model Partitioning with Low-Overhead Profiling on the PIM-based Platform for Deep Learning Inference.

Seok Young KimJaewook LeeYoonah PaikChang Hyun KimWon Jun LeeSeon Wook Kim
Published in: ACM Trans. Design Autom. Electr. Syst. (2024)
Keyphrases
  • deep learning
  • low overhead
  • probabilistic model
  • data sets
  • similarity measure
  • computer vision