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Optimal Model Partitioning with Low-Overhead Profiling on the PIM-based Platform for Deep Learning Inference.
Seok Young Kim
Jaewook Lee
Yoonah Paik
Chang Hyun Kim
Won Jun Lee
Seon Wook Kim
Published in:
ACM Trans. Design Autom. Electr. Syst. (2024)
Keyphrases
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deep learning
low overhead
probabilistic model
data sets
similarity measure
computer vision