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Low Dose-Rate, High Total Dose Set-Up for Rad-Hard CMOS I/O Circuits Testing.

Calogero PaceLetizia FragomeniAldo ParlatoAndrea SolanoNicolò MarcheseDaniela Fiore
Published in: ApplePies (2016)
Keyphrases
  • low dose
  • high speed
  • circuit design
  • computational complexity
  • multi view
  • gray level
  • computed tomography