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A Statistical Wafer Scale Error and Redundancy Analysis Simulator.
Atishay
Ankit Gupta
Rashmi Sonawat
Helik Kanti Thacker
Prasanth B
Published in:
VLSI-SoC (Selected Papers) (2019)
Keyphrases
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statistical analysis
error analysis
machine learning
image analysis
information theoretic
quantitative analysis
data mining
computer vision
reinforcement learning
data analysis
medical images
error rate
statistical inference