Application of Feature Selection Method to Error Factor Extraction of Multifunction Peripheral.
Myungsook KoTatsuya InagiMasaaki TakadaToru YanoPublished in: IEEM (2019)
Keyphrases
- detection method
- feature selection
- error rate
- high precision
- support vector machine
- mutual information
- preprocessing
- high accuracy
- dynamic programming
- experimental evaluation
- computational cost
- machine learning
- feature set
- significant improvement
- synthetic data
- segmentation method
- error analysis
- detection algorithm
- support vector machine svm
- text categorization
- unsupervised learning
- cost function
- computational complexity
- feature extraction
- decision trees
- learning algorithm