Analysis of Point Based Image Registration Errors With Applications in Single Molecule Microscopy.

Ed A. K. Cohen R. J. Ober

Published in: IEEE Trans. Signal Process. (2013)

Keyphrases

image analysis
registration errors
high resolution
input image
image features
image data
feature points
multiscale
image retrieval
low resolution images
single image
low resolution
region of interest
similarity measure
registration accuracy
machine learning
image registration
viewpoint
image processing